Acceptance Sampling Plan for Truncated Life Tests at Maximum Allowable Percent Defective

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dc.categoryJournal Article
dc.contributor.authorSudamani Ramaswamy, A R
dc.date.accessioned2017-03-31T23:03:15Z
dc.date.available2017-03-31T23:03:15Z
dc.date.issued2012
dc.departmentMathematicsen_US
dc.description.abstractThe paper deals with a reliability acceptance sampling plan developed through maximum allowable percent defective (MAPD) having the single sampling plan as attribute plan. By fixing MAPD, we here obtain the test termination ratios, assuming that the lifetime follows different distributions. Comparisons are made and examples are given to illustrate the procedure.en_US
dc.identifier.urihttps://ir.avinuty.ac.in/handle/avu/2474
dc.langEnglishen_US
dc.publisher.nameInternational Journal of Computating and Engineeringen_US
dc.publisher.typeInternationalen_US
dc.titleAcceptance Sampling Plan for Truncated Life Tests at Maximum Allowable Percent Defectiveen_US
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