Acceptance Sampling Plan for Truncated Life Tests at Maximum Allowable Percent Defective
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Date
2012
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Abstract
The paper deals with a reliability acceptance sampling plan developed through maximum allowable percent defective (MAPD)
having the single sampling plan as attribute plan. By fixing MAPD, we here obtain the test termination ratios, assuming that the
lifetime follows different distributions. Comparisons are made and examples are given to illustrate the procedure.