Structural and Optical Characterization of Tio2 Thin Film Deposited By Silar Method

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dc.contributor.advisorRachel Oommen
dc.contributor.authorSaranya, S
dc.date.accessioned2019-03-15T09:31:18Z
dc.date.available2019-03-15T09:31:18Z
dc.date.issued2011-05
dc.departmentPhysicsen_US
dc.identifier.urihttps://ir.avinuty.ac.in/handle/avu/5038
dc.langEnglishen_US
dc.publication.categoryOthersen_US
dc.publisher.typeOthersen_US
dc.titleStructural and Optical Characterization of Tio2 Thin Film Deposited By Silar Methoden_US
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