Relationship of Biometric Attendance System with Work Stress, Anxiety and Job Satisfaction in Teachers

Simple item page
dc.category
dc.contributor.advisorGovarthini, R
dc.contributor.authorVigashini, V
dc.date.accessioned2024-06-07T11:26:44Z
dc.date.available2024-06-07T11:26:44Z
dc.date.issued2023-05
dc.departmentPsychologyen_US
dc.identifier.urihttps://ir.avinuty.ac.in/handle/avu/17300
dc.langEnglishen_US
dc.publication.categoryOthersen_US
dc.publisher.typeOthersen_US
dc.titleRelationship of Biometric Attendance System with Work Stress, Anxiety and Job Satisfaction in Teachersen_US
Files
Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
21PCP020.pdf
Size:
1.52 MB
Format:
Adobe Portable Document Format
Download
Collections
PG Theses